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Lecturer(s)
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Volf Asrat Mamo, doc. Ing. Ph.D.
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Zeman Zbyněk, Ing.
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Course content
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1. Introduction to the subject, basic terms of microscopy, the accuracy of measurement in microscopy, evaluation of typical defects of electronic elements and assemblies according to the IPC standard. 2. Optical, fluorescence and confocal microscopy, contrast methods, AOI, image data analysis, Endoscopy 3. Transmission and scanning electron microscopy, spectroscopy 4. Metallography and materialography, techniques for defects investigation 5. X-ray imaging and computed tomography 6. Scanning Probe Microscopy, Scanning Acoustic Microscopy, Thermography
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Learning activities and teaching methods
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Laboratory work, Lecture
- Contact hours
- 39 hours per semester
- Preparation for comprehensive test (10-40)
- 30 hours per semester
- Preparation for laboratory testing; outcome analysis (1-8)
- 8 hours per semester
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| prerequisite |
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| Knowledge |
|---|
| understand written English |
| Competences |
|---|
| N/A |
| learning outcomes |
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| Knowledge |
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| Explain the basic concepts of optical microscopy |
| Describe the differences among the individual types of microscopes the imaging techniques |
| To clarify the principles of contrast methods, confocal and fluorescence microscopy |
| To clarify the principles of electron microscopy and scanning probe microscopy |
| To clarify the principles of 2D and 3D X-ray analysis |
| Describe the methods and procedures used to determine the elemental composition of the samples |
| Describe the methods and procedures used for the preparation of metallographic cross-sections |
| Skills |
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| Assess the suitability of individual diagnostic and microscopic methods according to the sample under examination |
| Perform microscopic inspection of samples and find defects |
| Evaluate the defects found on samples according to IPC standards and make conclusions |
| Create a report from an optical inspection |
| Apply the knowledge gained and clarify it to the professional public |
| Competences |
|---|
| N/A |
| teaching methods |
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| Knowledge |
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| Lecture |
| Skills |
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| Laboratory work |
| Multimedia supported teaching |
| Field trip |
| Individual study |
| Competences |
|---|
| Lecture |
| Individual study |
| Laboratory work |
| assessment methods |
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| Knowledge |
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| Test |
| Test with oral verification of knowledge |
| Skills |
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| Skills demonstration during practicum |
| Individual presentation at a seminar |
| Competences |
|---|
| Skills demonstration during practicum |
| Individual presentation at a seminar |
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Recommended literature
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Debashis Mukherji. Electron Microscopy - A Versatile Tool for Material Characterization. 2017. ISBN 978-87-403-1696-4.
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Goldstein, Joseph. Scanning electron microscopy and x-ray microanalysis. 3rd ed. New York : Springer, 2007. ISBN 978-0-306-47292-3.
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KARLÍK, Miroslav. Úvod do transmisní elektronové mikroskopie. Praha : Nakladatelství ČVUT, 2011. ISBN 978-87-403-1696-4.
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Macek, Karel; Hnilica, František,; Starý, Vladimír. Experimentální metody v materiálovém inženýrství. Vyd. 1. Praha : Nakladatelství ČVUT, 2008. ISBN 978-80-01-03934-2.
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